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IEEE Instrumentation and Measurement Society Meeting

Details:
Topic Sampling the Analog World
Speaker Albert DeWeese, Sr Testing and Test Automation Engineer, St Jude Medical
Date Thursday, 15 March 2012
Time Social/Networking/Lunch 11:30 AM / Program 12:00-12:45 PM
Location Dell Services
2300 W Plano Pkwy
Plano, TX 75075
Cost Cover Includes Lunch
FREE for I&M Members
$5 for IEEE Members, Guests, and non-IEEE members
RSVP Sam Broyles, sam.broyles@inovageo.com

Abstract:
Review of fundamental data acquisition concepts, including: ADC, DAC, Vertical and temporal resolution, Nyquist criterion, Aliasing, and Sources of error.

Bio:
Albert DeWeese works at St Jude Medical where he builds next generation automated systems to test implantable medical devices. Albert has 8 years of experience in automated test and measurement. He has lead cross functional engineering teams to successfully deliver sophisticated test systems in a broad range of markets including semiconductor and prime defense. He is a Certified Architect in NI LabVIEW and NI TestStand.

When
Thu Mar 15, 2012 11:30am – 12:45pm Central Time
Where
Dell Services (map)