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IEEE Instrumentation and Measurement Society Meeting

Topic Sampling the Analog World
Speaker Albert DeWeese, Sr Testing and Test Automation Engineer, St Jude Medical
Date Thursday, 15 March 2012
Time Social/Networking/Lunch 11:30 AM / Program 12:00-12:45 PM
Location Dell Services
2300 W Plano Pkwy
Plano, TX 75075
Cost Cover Includes Lunch
FREE for I&M Members
$5 for IEEE Members, Guests, and non-IEEE members
RSVP Sam Broyles,

Review of fundamental data acquisition concepts, including: ADC, DAC, Vertical and temporal resolution, Nyquist criterion, Aliasing, and Sources of error.

Albert DeWeese works at St Jude Medical where he builds next generation automated systems to test implantable medical devices. Albert has 8 years of experience in automated test and measurement. He has lead cross functional engineering teams to successfully deliver sophisticated test systems in a broad range of markets including semiconductor and prime defense. He is a Certified Architect in NI LabVIEW and NI TestStand.

Thu Mar 15, 2012 11:30am – 12:45pm Central Time
Dell Services (map)